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Fabry-Pérot Interference in Gapped Bilayer Graphene with Broken Anti-Klein Tunneling

机译:具有断裂的反克莱因隧道效应的带间隙双层石墨烯中的Fabry-Pérot干扰

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摘要

We report the experimental observation of Fabry-Pérot interference in the conductance of a gate-defined cavity in a dual-gated bilayer graphene device. The high quality of the bilayer graphene flake, combined with the device’s electrical robustness provided by the encapsulation between two hexagonal boron nitride layers, allows us to observe ballistic phase-coherent transport through a 1-μm-long cavity. We confirm the origin of the observed interference pattern by comparing to tight-binding calculations accounting for the gate-tunable band gap. The good agreement between experiment and theory, free of tuning parameters, further verifies that a gap opens in our device. The gap is shown to destroy the perfect reflection for electrons traversing the barrier with normal incidence (anti-Klein tunneling). The broken anti-Klein tunneling implies that the Berry phase, which is found to vary with the gate voltages, is always involved in the Fabry-Pérot oscillations regardless of the magnetic field, in sharp contrast with single-layer graphene.
机译:我们报告了法布里-佩罗干涉在双门双层石墨烯器件中门定义腔电导的实验观察。双层石墨烯鳞片的高质量,再加上两层六方氮化硼层之间的封装所提供的器件坚固的电学性能,使我们能够观察通过1μm长腔的弹道相干传输。通过与考虑到门可调带隙的紧密绑定计算进行比较,我们确定了观察到的干扰模式的起源。实验与理论之间的良好协议,没有调整参数,进一步验证了我们设备中的空白。结果表明,该间隙破坏了以正入射角穿过势垒的电子的完美反射(反克莱因隧穿)。断裂的反克莱因隧道效应意味着,随栅极电压而变化的贝里相始终与法布里-珀罗特振荡有关,而与磁场无关,与单层石墨烯形成鲜明对比。

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